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Agilent Atomic Spectroscopy On Demand Webinars

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Welcome to your one-stop for On-Demand Atomic Spectroscopy Webinars.

Driven by insights from customers from around the world, Agilent has created an innovative atomic spectroscopy portfolio – spanning instruments, consumables, standards, services, software, and more – to bring that confidence to your lab. Learn how Agilent’s latest atomic spectroscopy products and applications can help your lab be more productive and run more efficiently. Keep your instruments up and running longer with helpful tips for troubleshooting and routine maintenance.

Please select your technique of choice to customize your webinars below.

Energy and Chemical

Visit here for Energy and Chemical related application notes.

Title
Presenter
Intelligent Analysis of Wastewaters using an Agilent ICP-MS with Integrated Autodilutor
Yan Cheung, Ph.D., Application Scientist, Agilent Technologies, Inc.
Total content and speciation in non-conventional lipid feedstock for biofuel production
Santiago Martínez del Olmo, Ph.D., IFP Energies Nouvelles (Lyon, France)
Elemental Analysis of Metals in the Li-Battery Value Chain by ICP-MS
Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.
Jet Fuel by ICP-MS
Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.
Method and Application Review of ASTM D5185 for the Analysis of Used and Unused Lubricating and Base Oils by Inductively Coupled Plasma Atomic Emission Spectrometry
Paul Krampitz, Application Scientist, Agilent Technologies, Inc.
ASTM 8110 method: Standard Test Method for Elemental Analysis of Distillate Products by Inductively Coupled Plasma Mass Spectrometry (ICP-MS)
Yan Cheung, Ph.D., Applications Chemist, Agilent Technologies, Inc.
Determination of Extractable and Leachable Elements Using ICP-MS
Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.
Efforts Towards an ASTM Jet Fuel Method
Jenny Nelson, Application Scientist, Agilent
Method and Application Review of ASTM D5185 for the Analysis of Used and Unused Lubricating and Base Oils by Inductively Coupled Plasma Atomic Emission Spectrometry
Paul Krampitz, Application Scientist, Agilent Technologies, Inc
ASTM D8351-22: The newly approved Standard Test Method for Determination of Trace Elements in Biodiesel and Biodiesel Blends by Microwave Plasma Atomic Emission Spectrometry (MP-AES)
Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.; Paul Krampitz, Application Scientist, Agilent Technologies, Inc.
ASTM 8322: Elemental Analysis of Crude Oils and Residual Fuels Using MPAES
Greg Gilleland, Application Scientist, Agilent Technologies, Inc.
ASTM MP-AES Method- Efforts towards Finalizing the Biodiesel Method
Greg Gilleland, Application Scientist, Agilent
Jenny Nelson, Application Scientist, Agilent
Fast, Reliable Elemental Data in Organic Solvents with a Microwave Plasma Atomic Emission Spectrometer (MP-AES)
Greg Gilleland, Application Scientist, Agilent Technologies
Automating the Workflow for the Analysis of Soils by ICP-OES. Less Work, More Flow
Paul Krampitz, Application Scientist, Agilent Technologies, Inc
Semiconductor Applications and Setup for a variety of Solvents and Matrices by ICP-OES
Paul Krampitz Application Scientist, Agilent Technologies, Inc.
Lithium-Ion Battery Industry Chain: Quality Control Insights from Elemental Analysis of High TDS Raw Materials and More by ICP-OES
Ana García González. Atomic Spectroscopy Application Scientist, Agilent Technologies
Elemental Analysis of Lithium-ion Battery Cathode Materials using an ICP-OES
Sima Singha, Ph.D., ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.
Creating Helpful Incentives to Produce Semiconductors (CHIPS) Act – Is my laboratory ready to run semiconductor applications?
Greg Gilleland, Application Scientist, Agilent Technologies, Inc.
Part 1: Sample Preparation and Sample Introduction in ICP-OES, MP-AES, and ICP-MS
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Paul Krampitz, Application Scientist, Agilent
Part 2: New and Existing ASTM Methods in ICP-OES, MP-AES, and ICP-MS
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Paul Krampitz, Application Scientist, Agilent
Part 3: Energy and Chemical Applications in ICP-OES, MP-AES, and ICP-MS
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Paul Krampitz, Application Scientist, Agilent
Part 4: ICP-OES and MP-AES Software and Hardware live demo
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Paul Krampitz, Application Scientist, Agilent
Part 5: ICP-MS Software and Hardware live demo
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Paul Krampitz, Application Scientist, Agilent
Low Level Arsenic Analysis using Microwave Plasma-Atomic Emission Spectrometer (MP-AES)
Greg Gilleland, Application Scientist, Agilent Technologies
The Analysis of Petroleum and Petroleum Products with an Agilent ICP-MS system
Jenny Nelson, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Issues and Troubleshooting for Organic ICP-OES Analysis: Petrochemical Market Segment Focus
Paul Krampitz, Application Scientist, Agilent
The Analysis of Glycols and Coolants Using ICP-OES
Paul Krampitz, Application Scientist, Agilent
Analysis of Trace Elements in Neat Volatile Solvents Using the Agilent 5110 ICP-OES
Greg Gilleland, Application Scientist, Agilent
Automated Organic Analyses on an Agilent 7900 ICP-MS
Jon Talbott, Application Scientist, Agilent


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Environmental

Visit here for Environmental related application notes.

Title
Presenter
Elemental Analysis of Lithium-ion Battery
Sima Singha, Ph.D., ICP-OES, Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.;
Greg Gilleland, Application Scientist, Agilent Technologies, Inc.; Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.;
Determination of Elements in Foods in Accordance with US FDA EAM 4.7 ICP-MS Method
Sima Singha, Ph.D., ICP-OES Application Scientist,
Atomic Spectroscopy, Agilent Technologies, Inc.
Environmental Analysis via ICP-OES Part 2: A dive into EPA Method 200.7 and 6010
Sima Singha, Ph.D., ICP-OES Application Scientist,
Atomic Spectroscopy, Agilent Technologies, Inc.
Environmental Analysis via ICP-OES Part 1: A dive into EPA Method 200.7 and 6010
Sima Singha, Ph.D., ICP-OES Application Scientist,
Atomic Spectroscopy, Agilent Technologies, Inc.
Environmental Analysis via ICP-OES Part 1: A dive into EPA Method 200.7 and 6010
Ana García González. Atomic Spectroscopy Application Scientist, Agilent Technologies
Environmental Analysis via ICP-OES Part 2: A dive into EPA Method 200.7 and 6010
Sima Singha, Ph.D., ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.
The Journey from AA to ICP-MS in a Municipal Laboratory
Tamika Black, Senior Chemist, City of Raleigh
Environmental Analysis via ICP-OES Part 1: A dive into Sample Preparation and Digestion Techniques as well as Calibration Standard and QC Preparation for Trace Metal Analysis
Greg Gilleland, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Environmental Analysis via ICP-OES Part 1: A dive into Sample Preparation and Digestion Techniques as well as Calibration Standard and QC Preparation for Trace Metal Analysis
Greg Gilleland, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Environmental Analysis via ICP-OES Part 2: Exploring QC Parameter Setup as well as Tips and Tricks for Measuring Tough Samples while Achieving the High Sensitivity
Greg Gilleland, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Environmental Analysis via ICP-OES Part 3: Bring it all together with Data Analysis & Processing as well as Report Generation and Customization
Greg Gilleland, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Environmental Analysis with ICP-MS techniques Part 1: Getting excellent results without the complexity! Introduction to EPA 200.8, EPA 6020 methods workflow in ICP-MS
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Environmental Analysis with ICP-MS techniques Part 2: See it to believe it! Bring it All Together, an ICP-MS software and hardware live demo
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Environmental Analysis with ICP-MS techniques Part 3: Let’s take a deep dive! Advanced environmental ICP-MS applications and tips and tricks on getting excellent analytical results
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Avoiding Double Charged Interferences on Single Quadrupole ICP-MS
Jenny Nelson, Application Scientist, Agilent
Achieve better productivity in your elemental analysis: Switch from Flame Atomic Absorption (AAS) to MP-AES
Ana Garcia-Gonzalez, Applications Scientist, Agilent
Effortless Trace Element Analysis: Avoid Common Time Traps with a Smart ICP-MS
Bert Woods, Application Scientist, Agilent
EPA 200.8 Water ICP-MS Analyzer – Learn How This Integrated Package Ensures Your Lab is Up and Running Samples Quickly
Jason Wintrode, Application Engineer, Agilent
Lower Limits for Lead in Surface Wipes Testing are Coming - Is your lab ready?
Paul Krampitz, Application Scientist, Agilent
Chris Conklin, Application Scientist, Agilent
Rapid Mulitelement Nanoparticle Analysis of Environmental Matrices by sNP-ICP-MS
Craig Jones, Application Scientist, Agilent
Measuring Nanoparticles in the Environment on your Agilent 7900 ICP-MS
Jon Talbott, Application Scientist, Agilent
Elemental Speciation Techniques By HPLC-ICP-MS
Mark Kelinski, Product Specialist, Agilent
Analysis of Drinking & Waste Water Samples with Minimal Prep Time and Optimal Sample Throughput
Craig Jones, Application Scientist, Agilent
A Follow-Up to Speciation Made Simple: Let's Dive into the Advanced Speciation Software Capabilities!
Jon Talbott, Application Scientist, Agilent
Trace Metals Analysis for Environmental Applications by ICP-MS
Craig Jones, Application Scientist, Agilent
Single-Cell-ICP-MS Evaluations in Yeast, Green Alga, and Red Blood Cell Using Agilent 8900 ICP-QQQ
Craig Jones, ICP-MS Application Scientist, Agilent
Tetsuo Kubota, Application Chemist, Agilent


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Food and Cannabis

Visit here for Food and Cannabis related application notes.

Title
Presenter
Fast & Easy Food Analysis using FDA Method
EAM 4.4 using Agilent’s 5900 ICP-OES
Greg Gilleland, Application Scientist, Agilent
Technologies, Inc.
Determination of Arsenic Species in Accordance with US FDA EAM 4.10
and 4.11 by HPLC-ICP-MS Methods
Mark Kelinske, Application Scientist, Agilent
Technologies, Inc.; Jenny Nelson, Ph.D.,
Application Scientist, Agilent Technologies, Inc.
Part 1: Elemental Workflows in the Food and Cannabis Lab
Jenny Nelson, Application Scientist, Agilent
Craig Jones, Application Scientist, Agilent
Part 2: Elemental Sample Prep for the Food and Agriculture Lab - Optimizing Your System for High Matrix Samples
Jenny Nelson, Application Scientist, Agilent
Craig Jones, Application Scientist, Agilent
Part 3: Elemental Analysis, Putting it All Together – Agilent 7850 ICP-OMS with MassHunter 5.1 Live Demo & Agilent 5900 ICP-OES with ICP Expert Live Demo
Jenny Nelson, Application Scientist, Agilent
Craig Jones, Application Scientist, Agilent
Developing Consensus Methods for the Cannabis Industry
Jenny Nelson, Application Scientist, Agilent
Identifying the Geographical Origin of Rice Using Elemental Profiling and Multi-Modeling Approach
Jenny Nelson, Application Scientist, Agilent
Shuofei Dong, Ph.D., Senior Application Development Scientist, Agilent
Uses of profiling trace metals in food with ICP-MS and Mass Profiler Professional (MPP)
Jenny Nelson, Application Scientist, Agilent
Determination of the Geographic Origin of Spices Using ICP-OES, ICP-MS, and Mass Profile Professional
Lindsey Whitecotton, Global ICP-OES Supplies Product Manager, Agilent
Geographic Fingerprinting of Whiskey using the Agilent 5110 ICP-OES and Mass Profiler Pro (MPP) Software
Greg Gilleland, Application Scientist, Agilent


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Materials

Visit here for Materials related application notes.

Title
Presenter
Learn how the High Energy Hydrogen mode by ICP-MS can remove difficult interferences and provide low level Sulfur analysis
Jason Wintrode, Application Scientist, Agilent
Analysis of Single and Multielement Nanoparticles on the Agilent Triple Quadrupole ICP-MS with MS/MS
Jon Talbott, Application Scientist, Agilent
Optimizing your ICP-OES for analysis of Brine Solutions
Greg Gilleland, Application Scientist, Agilent
The Analysis of Single and Multiple Element Nanoparticles on the Agilent 8900 ICP-MS/MS
Bert Woods, Application Scientist, Agilent
Interference Correction Techniques for the Analysis of Trace Metals in Alloys using Agilent 5110 ICP-OES
Paul Krampitz, Application Scientist, Agilent
Demonstration of Trace Metals and Electronic Grade Materials Analysis Techniques and Strategies on Live Instrumentation
Bert Woods, Application Scientist, Agilent
Emmett Soffey, Product Specialist, Agilent
Sima Singha, Application Scientist, Agilent
Chris Conklin, Product Specialist, Agilent
Novel Advancements in Trace Level Determination and Longterm Stability of Metals in TMAH and UPW Matrices
Bert Woods, Application Scientist, Agilent
Emmett Soffey, Product Specialist, Agilent
Specialty Chemical Analysis using ICP-OES and AA
Sima Singha, Application Scientist, Agilent
Chris Conklin, Product Specialist, Agilent


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Mining

Visit here for Mining related application notes.

Title
Presenter
Part 1: The Mining Lifecycle and Elemental Analysis Workshop Series
Greg Gilleland, Application Scientist, Agilent
Part 2: The Mining Lifecycle and Elemental Analysis Workshop Series
Greg Gilleland, Application Scientist, Agilent
Part 3: The Mining Lifecycle and Elemental Analysis Workshop Series
Bastian Georg, Atomic Spectroscopy Application Scientist, Agilent
Geochemical Analysis at the Speed of Light with ICP-OES
Ana Garcia-Gonzalez, Atomic Spectroscopy Applications Scientist, Agilent


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Pharma

Visit here for Pharma related application notes.

Title
Presenter
USP 232/233 Elemental Impurities Analysis Part 1: Why USP and what laboratories need to be Ready and Successful
Bert Woods, Application Scientist, Agilent
USP 232/233 Elemental Impurities Analysis Part 2: The Compliance Toolbox - Tools to facilitate compliance and understanding FDA requirements, User responsibilities and Agilent solutions
Bert Woods, Application Scientist, Agilent
USP 232/233 Elemental Impurities Analysis Part 3: Bring it all together with Hardware and Software Live Demo for USP analysis.
Bert Woods, Application Scientist, Agilent


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Semiconductor

Visit here for Semiconductor related application notes.

Title
Presenter
Creating Helpful Incentives to Produce Semiconductors (CHIPS) Act – Is my laboratory ready to run semiconductor applications?
Mark Kelinske, Application Scientist, Agilent
Technologies, Inc.; Abe Gutierrez, Product Specialist, Agilent Technologies, Inc.; Emmett Soffey, ICP-MS Product Specialist, Agilent Technologies, Inc.
Ultratrace Element Analysis By ICP-MS/MS Under Robust Conditions Using Ion Optic Lenses
Bert Woods, Application Scientist, Agilent
Abe Gutierrez, Product Specialist, Agilent
Characterization of Synthesized Iron Nanoparticles in Hydrocarbon Matrices by Single Particle (sp) ICP-MS
Jenny Nelson, Ph.D., Application Scientist, Agilent Technologies, Inc.; Mark Kelinske, Application Scientist, Agilent Technologies, Inc.
Agilent M Lens for ICP-MS and the Semiconductor Industry
Bert Woods, Application Scientist, Agilent Technologies, Inc.
Single Particle ICP-MS Applications in Advanced Semiconductor Processes
Charlie (Qilin) Chan, Advanced Research Specialist, PhD, PMP, 3M Corporate Research Analytical Laboratory
Jenny Neslon, Application Scientist, Agilent
Automated Online Semiconductor Monitoring with ScoutDX, ScoutNANO, and RadianVPD
Kyle Uhlmeyer, RadianVPD Applications Manager, Elemental Scientific
Austin Schultz, Project Engineer, Elemental Scientific
Bert Woods, Application Scientist, Agilent
Resolving Interferences in Organic Solvents Using the Agilent 8900 ICP-MS/MS
Bert Woods, Application Scientist, Agilent
Emerging Applications in the Semiconductor Industry by ICP-MS
Bert Woods, Application Scientist, Agilent
Advances to Inorganic Mass Spectrometry with MS/MS Technology
Craig Jones, ICP-MS Application Scientist, Agilent


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Principles, Tips & Tricks

Visit here for All Atomic Spectroscopy related application notes.

Title
Presenter
Learn Why Atomic Absorption, MicroWave, and ICP Plasma Spectroscopy are the Perfect Tools for Both a Teaching and Research Environment
Paul Krampitz, Application Scientist,
Agilent Technologies, Inc.
Learn Why Atomic Absorption, MicroWave, and ICP Plasma Spectroscopy are the Perfect Tools for Both a Teaching and Research Environment
Paul Krampitz, Application Scientist,
Agilent Technologies, Inc.
ICP-MS Tips and Tricks for Tuning and achieving the best Sensitivity and Detection Limits
Bert Woods, Application Scientist,
Agilent Technologies, Inc.
Ready to replace your 700 series ICP-OES? The latest 5800 or 5900 will exceed your expectations! Part 2
Sima Singha, Ph.D., ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.; Steve Wall, Product Specialist,
Agilent Technologies, Inc.
Ready to replace your 700 series ICP-OES? The latest 5800 or 5900 will exceed your expectations! Part 1
Sima Singha, Ph.D., ICP-OES Application Scientist, Atomic Spectroscopy, Agilent Technologies, Inc.; Steve Wall, Product Specialist,
Agilent Technologies, Inc.
Got ICP-OES questions? We got answers!
Got ICP-OES questions? We got answers! Greg Gilleland, Application Scientist,
Agilent Technologies, Inc.
New Year resolution for my ICP-OES: I will keep my ICP-OES analysis free from contaminants
Ana García González, Atomic Spectroscopy Application Scientist,
Agilent Technologies, Inc.
Interference removal/mitigation utilizing ICP-MS/MS and single unit mass resolution technology
L. Craig Jones, ICP-MS Application Scientist,
Agilent Technologies, Inc.
Fundamentals of Atomic Spectrometry: ICP-QQQ
Bert Woods, Application Scientist,
Agilent Technologies, Inc.
Fundamentals of Atomic Spectroscopy: ICP-OES
Ana García González, Atomic Spectroscopy Application Scientist,
Agilent Technologies
The importance of controlling contamination and choosing the right sample introduction system even before you start your analysis to achieve the best detection limits
Bert Woods, Application Scientist,
Agilent Technologies, Inc
The importance of tuning and setting up your method on your ICPMS to achieve the best detection limits
Bert Woods, Application Scientist,
Agilent Technologies, Inc
Ready to replace your 7700? The latest 7850 or 7900 will exceed your expectations! Part 2
L. Craig Jones, ICP-MS Application Scientist, Agilent Technologies, Inc; Emmett Soffey, ICP-MS Product Specialist, Agilent Technologies, Inc.
Ready to replace your 7700? The latest 7850 or 7900 will exceed your expectations! Part 1
Yan Cheung, Ph.D., Applications Chemist, Agilent Technologies, Inc.; Emmett Soffey, ICP-MS Product Specialist, Agilent Technologies, Inc.
Got ICP-MS questions? We got answers!
Yan Cheung, Ph.D., Applications Chemist,
Agilent Technologies, Inc
New Year resolution for my ICP-MS: I will keep my ICP-MS analysis free from contaminants
Yan Cheung, Ph.D., Applications Chemist,
Agilent Technologies, Inc
Fundamentals of Atomic Spectrometry: ICP-MS
Yan Cheung, Ph.D., Applications Chemist,
Agilent Technologies, Inc
Fundamentals of Atomic Spectroscopy: MP-AES
Sima Singha, Ph.D., ICP-OES Application Scientist,
Atomic Spectroscopy, Agilent Technologies, Inc.
How to pump the sample to the spectrometer for the best results
Gareth Pearson, Ph.D., Product Manager ICP-MS Supplies, Agilent
Lindsey Whitecotton, ICP-OES Supplies Product Manager, Agilent
Part 2: How timely information and supplies can make you an ICP-OES Expert
Lindsey Whitecotton, ICP-OES Supplies Product Manager, Agilent
Part 1: How timely information and supplies can make you an ICP-MS Expert
Gareth Pearson, Ph.D., Product Manager ICP-MS Supplies, Agilent
Fundamentals of Atomic Spectroscopy: AA
Greg Gilleland, Application Scientist, Agilent Technologies, Inc.
Agilent Inorganic Standard Portfolio and Website Tools: Part 2 - ICP-OES/MP-AES/AA
Fred Chan, Chemical Standards Product Manager - CSD, Agilent
Mitesh Patel, Chemical Standards Product Manager - CSD, Agilent
Agilent Inorganic Standard Portfolio and Website Tools: Part 1 - ICP-MS
Fred Chan, Chemical Standards Product Manager - CSD, Agilent
Mitesh Patel, Chemical Standards Product Manager - CSD, Agilent
Software BootCamp Kick-off - MP-AES
Greg Gilleland, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-OES Part 3
Ana García-González, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Greg Gilleland, Application Scientist, Agilent
Paul Krampitz, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-OES Part 2
Ana García-González, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Greg Gilleland, Application Scientist, Agilent
Paul Krampitz, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-OES Part 1
Ana García-González, Application Scientist, Agilent
Sima Singha, PhD, Application Scientist, Agilent
Greg Gilleland, Application Scientist, Agilent
Paul Krampitz, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-MS Part 3
Bert Woods, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-MS Part 2
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Software BootCamp Kick-off - ICP-MS Part 1
Bert Woods, Application Scientist, Agilent
Yan Cheung, Applications Chemist, Agilent
Craig Jones, Application Scientist, Agilent
Learn how to achieve ultimate sensitivity with advanced tuning on Triple Quadrupole ICP-MS (ICP-QQQ)
Bert Woods, Application Scientist, Agilent
Powering the Lab of the Future: Agilent’s Smart ICP-OES
Chris Conklin, Product Specialist, Agilent
New Year resolution for my ICP-OES: I will keep my ICP-OES analysis free from contaminants
Greg Gilleland, Application Scientist, Agilent
New Year resolution for my ICP-MS: I will keep my ICP-MS analysis free from contaminants
Yan Cheung, Applications Chemist, Agilent
Tips & Tricks to increase Productivity on ICP-OES
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
The Need for Speed: Improving Throughput and Reducing Maintenance in ICP-MS
Craig Jones, ICP-MS Application Scientist, Agilent
The New Agilent ICP: Give us 17 Seconds and We'll save you Days of Method development Time and Double Your Productivity
Paul Krampitz, Application Scientist, Agilent
From High Matrix to Low Levels: How to Handle Matrix Interferences on ICP-MS
Yan Cheung, Applications Chemist, Agilent
Automate Method Development using a Smart ICP-OES
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Analytical Plasma Fundamentals and the Impact on your Results
Yan Cheung, Applications Chemist, Agilent
Learn how to Confirm your Data on ICP-OES. Are you getting the Right Result? Are You Sure?
Paul Krampitz, Application Scientist, Agilent
How to Minimize Contamination and Carry Over Issues on ICP-MS
Jason Wintrode, Application Scientist, Agilent
Discover an Automated Sample Screening that Intelligently Develops ICP-OES Methods
Greg Gilleland, Application Scientist, Agilent
Removing Difficult Isobaric Overlaps using Triple Quadrupole ICP-MS (ICP-QQQ) is Simple: If you have MS/MS
Craig Jones, ICP-MS Application Scientist, Agilent
Worry Less, Analyze More: How Advances in ICP-OES Sample Introduction Systems Can Reduce Downtime and Simplify Maintenance
Lindsey Whitecotton, Global ICP-OES Supplies Product Manager, Agilent
How Can You Leverage SemiQuant Analysis on an ICP-OES System? Learn About All of the Capabilities of the Agilent ICP-OES
Paul Krampitz, Application Scientist, Agilent
ICP-OES: Basic Tips and Tricks and Maintenance
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Discover how Microwave Plasma-Atomic Emission Spectrometer (MP-AES) offers superior workflow productivity over Flame Atomic Abs
Ana Garcia-Gonzalez, Atomic Spectroscopy Applications Scientist, Agilent
Are Your ICP-OES Results Optimized? Discover how to simplify Method Development and Data Analysis on ICP-OES
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Unearth the importance of Single Mass Resolution for MS/MS with Triple Quadrupole ICP-MS (ICP-QQQ)
Craig Jones, ICP-MS Application Scientist, Agilent
Tips & Tricks to Ensure you are getting the Correct Results from your Flame Atomic Absorption
Paul Krampitz, Application Scientist, Agilent
Take a deep dive with us and learn Advanced Tuning Tips and Tricks for Single Quadrupole ICP-MS
Bert Woods, Application Scientist, Agilent
Are ICP-OES Interferences Giving You Concern? Learn How to Remove Spectral Interferences and Improve Accuracy on the Agilent ICP
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Did You Know MassHunter Has a Custom Report Designer? Learn How to Setup Your Own Custom ICP-MS Reports Like a PRO!
Bert Woods, Application Scientist, Agilent
Method Development Tips for ICP-OES: Wavelength Selection Considerations for Optimal Sensitivity and Linearity
Tina Harville, Applications Engineer, Agilent
Know What’s in Your Sample Without Quantitative Analysis: The Benefits of Using SemiQuant Analysis on ICP-OES
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
IEC Implementation and Alternate Spectral Interference Techniques on the Agilent 5110 ICPOES
Greg Gilleland, Application Scientist, Agilent
Learn How to Optimize Your Single Quadrupole ICP-MS to Obtain the Best Detection Limits with Challenging Elements
Craig Jones, ICP-MS Application Scientist, Agilent
Get the Most Out of Your AA - Achieve the Productivity and Speed of Sequential ICP-OES with Agilent’s AA Systems
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Minimize Carry Over and Contamination on Your Agilent ICP-MS
Jon Talbott, Application Scientist, Agilent
How to Optimize Your ICP-OES Sample Introduction System for Your Samples Type
Paul Krampitz, Application Scientist, Agilent
No Standards, No Problem: Maximizing the Power of ICP-MS Using Semiquantitative Analysis
Bert Woods, Application Scientist, Agilent
Agilent-patented Fast Sequential Flame AA – Kickstarting Your Elemental Analysis without the high cost of Argon
Greg Gilleland, Application Scientist, Agilent
Learn how to get the most out of your ICP-MS: Tips and Tricks on ICP-MS Maintenance
Jason Wintrode, Application Scientist, Agilent
Get the Most out of your AA/MP by learning to Optimize each technique for your application
Paul Krampitz, Application Scientist, Agilent
Get the most out of your ICP-OES: Tips & Tricks to increase Productivity
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
ICPGO – Fast, Easy, GO! – Elemental Analysis Made Easy
Bert Woods, Application Scientist, Agilent
Analysis of Hg, As and Se by Hydride Generation using the Agilent 4210 MP-AES and the Multi-mode Sample Introduction System
Greg Gilleland, Application Scientist, Agilent
Method Development and Data Interpretation on Agilent's 5110 ICP-OES
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
ICP Flow Injection Analysis: Applications and Optimization of the AVS 7
Paul Krampitz, Application Scientist, Agilent
ICP-MS Maintenance, Tips and Tricks
Craig Jones, ICP-MS Application Scientist, Agilent
Boost the Performance of Your ICP-OES With High-Speed AVS7 Switching Valve
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Tuning Your ICP-MS Instrument for Excellent Sensitivity and Long-Term Stability
Chris Scanlon, Application Scientist, Agilent
Lower the Detection Limits On ICP-OES Using Some Simple Tricks
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Increasing Sample Throughput on The Agilent ICP-MS Portfolio
Mark Kelinski, ICP-MS Product Specialist, Agilent
What Internal Standards In AA? How Can That Be? Autodilution Too? We've Got Both On Agilent Flame AAs With Fast Sequential And SIPS!
Jon Talbott, Application Scientist, Agilent
The Importance of Single Mass Resolution When Using MS/MS Technology Via the Agilent 8900 ICP-MS/MS
Bert Woods, Application Scientist, Agilent
ICP-OES Method/Instrument Optimization
Sima Singha, PhD, ICP-OES Application Scientist, Atomic Spectroscopy, Agilent
Screening Collection Containers in Semiquant Analysis Mode
Riley Murphy, PhD, Technical Director of the Metals Department, NMS Labs


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