ICP-MS sampler cone, platinum-tip with nickel-plated base
ICP-MS Sampler Cones & Care Packages
The ICP-MS sampler cone forms part of the interface region, sampling ions from the atmospheric plasma and transitioning them into the high vacuum MS for detection. High-quality sample cones are key to the sensitivity and stability of an ICP-MS.
Agilent sampler cones, with a nickel or platinum tip, use high-purity materials to minimize background and ensure stability within the plasma. They are manufactured to stringent specifications and rigorously tested to ensure excellent batch to batch reproducibility. The orifice dimensions and tip geometry are optimized and tightly controlled as they are key parameters defining an ICP-MS's sensitivity, background level, oxide and doubly charged ratio and matrix tolerance which are all critical parameters to achieve successful measurements of elemental content in a sample.
For demanding applications such as semiconductors and advanced materials, the Pt-tip cones allow to achieve the lowest backgrounds.
Agilent sampler cones, with a nickel or platinum tip, use high-purity materials to minimize background and ensure stability within the plasma. They are manufactured to stringent specifications and rigorously tested to ensure excellent batch to batch reproducibility. The orifice dimensions and tip geometry are optimized and tightly controlled as they are key parameters defining an ICP-MS's sensitivity, background level, oxide and doubly charged ratio and matrix tolerance which are all critical parameters to achieve successful measurements of elemental content in a sample.
For demanding applications such as semiconductors and advanced materials, the Pt-tip cones allow to achieve the lowest backgrounds.
Product Details
Features
- Choose economic Ni-tipped cones for good chemical resistance and lifetime for routine applications.
- Choose Pt-tipped cones for chemical resistance to aggressive matrices and the lowest backgrounds required for trace analysis.
- Choose SC (semiconductor) Pt-tipped cones for the advanced applications such as semiconductors and advanced materials to achieve the absolute lowest backgrounds for ultra-trace analysis.
- Sampler cones with Ni-plated copper base provide longer lifetime and less maintenance when analyzing matrix containing HCl, Aqua Regia or HF.
- Genuine Agilent interface cones come with 100% quality inspection and deliver superior sensitivity across the mass range.
- Check the graphite gasket (p/n G3280-67009) each time you remove the sampler cone and replace if damaged.
- Our handy ICP-MS interface cone magnifier tool (p/n 5190-9614) makes inspection of your cone orifice simple for reliable cone performance.
How It Works
Applications